Sensitivity Issues in Step-scan FT-IR Spectrometry

C.J. Manning

This work was presented at Pittcon '95 on March 06, 1995 in the New Orleans, LA. (Abstract number 245) This material is the subject of a full-length publication titled "Noise Sources in Step-scan FT-IR Spectrometry," C. J. Manning and P. R. Griffiths, Applied Spectroscopy 51, 1092 (1997).

• Title
• Outline
• Comparison of Rapid-scan and Step-scan SNR
• SNR in Difference Spectrum
• Rapid-scan Frequency Spectrum
• Quote 1
• Step-scan Frequency Spectrum
• Quote 2
• Clues to the Nature of the Excess Noise
• Effect of Multiplicative Noise
• Largest Multiplicative Noise Mixing Only Adjacent Elements
• Possible Instabilities
• Temperature Sensitivity of Beamsplitter
• Refractive Index Variation
• Picture of Step-scan Spectrometer
• Picture of Infrared Source
• Picture of Interferometer and Reference Laser
• Picture of Optical Bench with Insulation Blanket
• Stability Tests
• Helium vs. Air Purge
• 100% Line without Insulation/Convection Control
• 100% Line with Insulation/Convection Control
• Conclusion
• Acknowledgements
• Contact Information