Up ] Next ]

Sensitivity Issues in Step-Scan FT-IR Spectrometry

This work began in Richard Palmer's lab at Duke University in 1986, moved in 1992 to Peter Griffith's lab at the University of Idaho, and continues today at Manning Applied Technology. During this 8 year period we have struggled with unknown noise sources in step-scan experiments. Only recently has a basic understanding of the problem been achieved.

 
Home - Polymer Modulator ™ - Rotating Interferometers - Step-scan Technology
Signal Processing Technology - MAT T-shirts - Bibliography - Links - Private Idaho
Copyright © 1995-2000 All Rights Reserved / webmaster@appl-tech.com