Sensitivity Issues in Step-Scan FT-IR Spectrometry 
A noise-free interferogram transforms to a noise-free spectrum. If
multiplicative noise affects the interferogram, the Fourier transform of the noise
function is convolved with the true spectrum. In step-scan measurements, the instrument
can drift significantly between sampling points (steps). In rapid-scan measurements, the
same drifts occur but the instrument condition remains approximately the same for the
period of a single mirror sweep. Thus, the drift multiplies the entire interferogram by a
constant value, influencing the apparent spectral energy, but not introducing
high-frequency noise into the spectrum.
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